ToScaLab

Total Scattering Laboratory

To.Sca.Lab.

ToScaLab

2019


F. Bertolotti, G.Nedelcu, A. Vivani, A. Cervellino, N. Masciocchi, A. Guagliardi, M.V. Kovalenko
Crystal Structure, Morphology, and Surface Termination of Cyan-Emissive, Six-Monolayers-Thick CsPbBr3 Nanoplatelets from X-ray Total Scattering, ACS Nano, (2019),  13, 14294-14307 [DOI]


A.F. Gualtieri, G.D. Gatta, R. Arletti, G. Artioli, P. Ballirano, G. Cruciani, A. Guagliardi, D. Malferrari, N. Masciocchi, P. Scardi
Analisi di fase quantitativa mediante metodo Rietveld: verso un protocollo di verifica di autenticità e qualità dei referti.
La Chimica e l'Industria online, (2019), 3, 34-37 [DOI]


A.F. Gualtieri, G.D. Gatta, R. Arletti, G. Artioli, P. Ballirano, G. Cruciani, A. Guagliardi, D. Malferrari, N. Masciocchi, P. Scardi
Quantitative phase analysis using the Rietveld method: towards a procedure for checking the reliability and quality of the results
Periodico di Mineralogia, (2019), 8, 147-151 [pdf]
 

  
 
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